In high-reliability applications such as military communications, Low Earth Orbit (LEO) satellites, 5G Non-Terrestrial Networks (NTN), and maritime radar, the failure of an RF system does not always stem from obvious external structural damage. Many long-term reliability issues may instead originate from microscopic leaks and material degradation within RF connectors, feedthroughs, or equipment bulkhead interfaces.
Some RF connectors featuring IP67 or IP68 protection ratings may still face an increased risk of moisture ingress after prolonged exposure to thermal cycling, high humidity, salt fog, or pressure variations. This is often due to the aging of sealing materials, interface relaxation, assembly defects, or the formation of micro-leakage paths. When moisture or corrosive contaminants penetrate the RF transmission structure, they can trigger the following failure chain:
Moisture Ingress → Condensation / Electrolyte Formation → Contact or Surface Corrosion → Alteration of Contact Resistance and Dielectric Environment → Impedance Discontinuity → VSWR / Return Loss Degradation → Increased Insertion Loss → Decline in RF System Reliability.
Therefore, for high-reliability equipment that requires long-term isolation from gases and water vapor, Glass-to-Metal Sealing (GTMS) is often employed to form a Hermetic Seal. Unlike conventional polymer seals, glass is an inorganic material capable of forming a low-permeability, permanent sealing structure. Consequently, it is widely utilized in vacuum bulkheads, electronic packaging, and high-reliability feedthroughs.
